Proceedings

Model-Based Probabilistic Reasoning for Electronics Troubleshooting

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Proceedings of the Eighth International Joint Conference on Artificial Intelligence. Expert Systems. Pages 207-210.

Abstract

IN-ATE is an on-going project aimed at developing expert consultant systems for guiding a novice technician through each step of an electronics troubleshooting session . One goal of the project is to automatically produce, given a set of initial symptoms. a binary (pass /fail) decision tree of testpoints to be checked by the technician. This paper discusses our initial approach using a modified game tree search technique, the gam.ma miniaverage method . One of the parameters which guides this search technique - the cost of each test - is stored a priori . The two other parameters that guide it - the conditional probability of test outcomes and the proximity to a solution - are provided by a dynamic model of an expert troubleshooter's beliefs about what in the device is good and what is bad . This model of beliefs is updated using probabilistic "test"T'esult .... plausible-consequences" rules. These rules are either provided by an expert technician. or approximated by a model-guided Rule Generator. The model that guides the generation of rules is a simple block diagram of the Unit Under Test (UUT) augmented with component failure rates.

Richard R. Cantone, Frank J. Pipitone, W. Brent Lander, and Michael P. Marrone. 1983. Model-Based Probabilistic Reasoning for Electronics Troubleshooting. In Proceedings of the Eighth International Joint Conference on Artificial Intelligence, IJCAI-83. IJCAI, 207–210. https://ijcai.org/proceedings/1983/49
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