{"type":"ScholarlyArticle","title":"Adaptive Pattern Recognition","authors":[{"name":"P. Hauff","slug":"p-hauff","given":"P.","family":"Hauff","affiliation":""},{"name":"E. Neidhart","slug":"e-neidhart","given":"E.","family":"Neidhart","affiliation":""}],"abstract":"A store of characteristic patterns of features is a fundamental requirement for pattern recognition . This store may be compiled either by intuition or by mathematical analysis of representative patterns. The precision of the mathematical method is considerably enhanced by statistical analysis of numerous representative patterns. This statistical method is employed in the BSM character recognition system. The_system is not only a reader, but also forms part of a statistical pattern analysator in order to create optimal read only stores of representative pattern features. Th e process forms an adaptive system suitable for reading characters of any given font , generated by machine or handprinting. For each font classification rules based on a sufficient set of test samples can be built.","doi":null,"url":"https://ijcai.org/proceedings/1969/19","pdf":"https://ijcai.org/proceedings/1969/0019.pdf","markdown":"https://ijcai.org/proceedings/1969/19.md","bibtex":"https://ijcai.org/proceedings/1969/bibtex/19","volume":{"slug":"1969","title":"Proceedings of the First International Joint Conference on Artificial Intelligence","short_title":"IJCAI 1969","url":"https://ijcai.org/proceedings/1969/","year":1969,"location":"Washington, DC, USA","dates":"May 7-9, 1969","editors":"Donald E. Walker and David C. Cooper","isbn":"","publisher":"International Joint Conferences on Artificial Intelligence","doi_prefix":""},"section":"Pictorial Pattern Recognition","track":"Pictorial Pattern Recognition","number":19,"pages":{"first":185,"last":192},"keywords":[],"videos":[],"references":[],"license_note":"Copyright International Joint Conferences on Artificial Intelligence."}